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Takashi Mochiyama: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Daisuke Maruyama, Akira Kanuma, Takashi Mochiyama, Hiroaki Komatsu, Yaroku Sugiyama, Noriyuki Ito
    Detection of multiple transitions in delay fault test of SPARC64 microprocessor. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2004, pp:893-898 [Conf]
  2. Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama
    BIST-Aided Scan Test - A New Method for Test Cost Reduction. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:359-364 [Conf]

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