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David J. Campbell: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech
    Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1120-1129 [Conf]

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