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D. Chandra Sekhar: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. S. K. Manhas, D. Chandra Sekhar, A. S. Oates, M. M. De Souza
    Characterisation of series resistance degradation through charge pumping technique. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:4, pp:617-624 [Journal]
  2. M. M. De Souza, S. K. Manhas, D. Chandra Sekhar, A. S. Oates, Prasad Chaparala
    Influence of mobility model on extraction of stress dependent source-drain series resistance. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:1, pp:25-32 [Journal]

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