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Harry A. Schafft: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Constance E. Schuster, Mark G. Vangel, Harry A. Schafft
    Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:2, pp:239-252 [Journal]
  2. Harry A. Schafft, Linda M. Head, Jason Gill, Timothy D. Sullivan
    Early reliability assessment by using deep censoring. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:1, pp:1-16 [Journal]
  3. A. Emre Yarimbiyik, Harry A. Schafft, Richard A. Allen, Mona E. Zaghloul, David L. Blackburn
    Modeling and simulation of resistivity of nanometer scale copper. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:7, pp:1050-1057 [Journal]

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