Journals in DBLP
News. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:3-4 [Journal ] Mani Soma Guest Editor's Introduction: Mixing Analog and Digital Systems. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:6-7 [Journal ] Brian A. A. Antao , Arthur J. Brodersen Techniques for Synthesis of Analog Integrated Circuits. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:8-18 [Journal ] Alvernon Walker , Winser E. Alexander , Parag K. Lala Fault Diagnosis in Analog Circuits Using Element Modulation. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:19-29 [Journal ] Mustapha Slamani , Bozena Kaminska Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:30-39 [Journal ] William R. Simpson , John W. Sheppard System Testability Assessment for Integrated Diagnostics. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:40-54 [Journal ] Don L. Millard , Karl R. Umstadter , Robert C. Block Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:55-63 [Journal ] Antonio Lloy Advanced Fault Collapsing (Logic Circuits Testing). [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:64-71 [Journal ] Ashish Pancholy , Janusz Rajski , Larry J. McNaughton Empirical Failure Analysis and Validation of Fault Models in CMOS VLSI Circuits. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:72-83 [Journal ] VLSI design. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:95-0 [Journal ] TTTC Newsletter. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:100-101 [Journal ] DATC Newsletter. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:1, pp:102-103 [Journal ]