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Sungbae Hwang: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Sungbae Hwang, Jacob A. Abraham
    Selective-run built-in self-test using an embedded processor. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2002, pp:124-129 [Conf]
  2. Sungbae Hwang, Jacob A. Abraham
    Optimal BIST Using an Embedded Microprocessor. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:736-745 [Conf]
  3. Hak-soo Yu, Sungbae Hwang, Jacob A. Abraham
    DSP-Based Statistical Self Test of On-Chip Converters. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:83-88 [Conf]
  4. Sungbae Hwang, Jacob A. Abraham
    Test data compression and test time reduction using an embedded microprocessor. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2003, v:11, n:5, pp:853-862 [Journal]

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