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Victor P. Nelson: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Thomas S. Barnett, Adit D. Singh, Victor P. Nelson
    Yield-Reliability Modeling for Fault Tolerant Integrated Circuits. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:29-38 [Conf]
  2. Christopher G. Knight, Adit D. Singh, Victor P. Nelson
    An IDDQ Sensor for Concurrent Timing Error Detection. [Citation Graph (0, 0)][DBLP]
    DFT, 1997, pp:281-289 [Conf]
  3. Thomas S. Barnett, Adit D. Singh, Victor P. Nelson
    Estimating burn-in fall-out for redundant memory. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:340-347 [Conf]
  4. D. V. Satishchandra, Victor P. Nelson
    A Reconfigurable Distributed Digital Filter. [Citation Graph (0, 0)][DBLP]
    IEEE Real-Time Systems Symposium, 1980, pp:90-96 [Conf]
  5. Thomas S. Barnett, Adit D. Singh, Victor P. Nelson
    Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:326-332 [Conf]
  6. Victor P. Nelson
    Fault-Tolerant Computing: Fundamental Concepts. [Citation Graph (0, 0)][DBLP]
    IEEE Computer, 1990, v:23, n:7, pp:19-25 [Journal]
  7. Victor P. Nelson
    Which tester is right for your MCM? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:4, pp:4-5 [Journal]
  8. C.-J. Wang, Victor P. Nelson
    Petri net performance modeling of a modified mesh-connected parallel computer. [Citation Graph (0, 0)][DBLP]
    Parallel Computing, 1991, v:17, n:1, pp:75-84 [Journal]
  9. Suchai Thanawastien, Victor P. Nelson
    Interference Analysis of Shuffle/Exchange Networks. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1981, v:30, n:8, pp:545-556 [Journal]
  10. Thomas S. Barnett, Adit D. Singh, Victor P. Nelson
    Extending integrated-circuit yield-models to estimate early-life reliability. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:3, pp:296-300 [Journal]

  11. Application of Embedded Systems in Low Earth Orbit for Measurement of Ionospheric Anomalies. [Citation Graph (, )][DBLP]


  12. Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems. [Citation Graph (, )][DBLP]


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