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V. R. Devanathan: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. V. R. Devanathan
    Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:300-305 [Conf]
  2. D. Janaki Ram, M. A. Maluk Mohamed, V. R. Devanathan
    A Framework for Concurrency Control in Real-Time Distributed Collaboration for Mobile Systems. [Citation Graph (0, 0)][DBLP]
    ICDCS Workshops, 2003, pp:488-492 [Conf]
  3. C. P. Ravikumar, R. Dandamudi, V. R. Devanathan, N. Haldar, K. Kiran, P. S. Vijay Kumar
    A Framework for Distributed and Hierarchical Design-for-Test. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2005, pp:497-503 [Conf]
  4. V. R. Devanathan, C. P. Ravikumar, V. Kamakoti
    Reducing SoC Test Time and Test Power in Hierarchical Scan Test : Scan Architecture and Algorithms. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2007, pp:351-356 [Conf]
  5. V. R. Devanathan, C. P. Ravikumar, V. Kamakoti
    Glitch-Aware Pattern Generation and Optimization Framework for Power-Safe Scan Test. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:167-172 [Conf]
  6. V. R. Devanathan, C. P. Ravikumar, V. Kamakoti
    Interactive presentation: On power-profiling and pattern generation for power-safe scan tests. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:534-539 [Conf]
  7. V. R. Devanathan, C. P. Ravikumar, V. Kamakoti
    On Reducing Peak Capture Power of Transition Delay Fault Test for SoCs with Unwrapped Cores. [Citation Graph (0, 0)][DBLP]
    J. Low Power Electronics, 2006, v:2, n:3, pp:464-476 [Journal]

  8. Methodology for low power test pattern generation using activity threshold control logic. [Citation Graph (, )][DBLP]

  9. Variation-Tolerant, Power-Safe Pattern Generation. [Citation Graph (, )][DBLP]

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