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Publications of Author

1. Michiel M. Ligthart, Emile H. L. Aarts, Frans P. M. Beenker
   Design-for-testability of PLA's using statistical cooling. [Citation Graph (0, 0)][DBLP]
   DAC, 1986, pp:339-345 [Conf]
   
2. Frans P. M. Beenker
   Systematic and Structured Methods for Digital Board Testing. [Citation Graph (0, 0)][DBLP]
   ITC, 1985, pp:380-385 [Conf]
   
3. Frans P. M. Beenker, Rob Dekker, Rudi Stans, Max Van der Star
   A Testability Strategy for Silicon Compilers. [Citation Graph (0, 0)][DBLP]
   ITC, 1989, pp:660-669 [Conf]
   
4. Frans P. M. Beenker, Rob Dekker, Loek Thijssen
   Fault Modeling and Test Algorithm Development. [Citation Graph (0, 0)][DBLP]
   ITC, 1988, pp:343-352 [Conf]
   
5. Frans P. M. Beenker, Rob Dekker, Loek Thijssen
   A Realistic Self-Test Machine for Static Random Access Memories. [Citation Graph (0, 0)][DBLP]
   ITC, 1988, pp:353-361 [Conf]
   
6. Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker
   Macro Testability: The Results of Production Device Applications. [Citation Graph (0, 0)][DBLP]
   ITC, 1992, pp:232-241 [Conf]
   
7. Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker
   Minimizing Test Time by Exploiting Parallelism in Macro Test. [Citation Graph (0, 0)][DBLP]
   ITC, 1993, pp:451-460 [Conf]
   
8. Frans P. M. Beenker, Barry J. Dekker, Richard Stans, Max Van der Star
   Implementing Macro Test in Silicon Compiler Design. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:2, pp:41-51 [Journal]
   
9. Rob Dekker, Frans P. M. Beenker, Loek Thijssen
   A realistic fault model and test algorithms for static random access memories. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 1990, v:9, n:6, pp:567-572 [Journal]