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Publications of Author

1. Xinghao Chen, Tom Snethen, Joe Swenton, Ron Walther
   A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1999, pp:321-326 [Conf]
   
2. Bernd Könemann, Carl Barnhart, Brion L. Keller, Tom Snethen, Owen Farnsworth, Donald L. Wheater
   A SmartBIST Variant with Guaranteed Encoding. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2001, pp:325-0 [Conf]
   
3. Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams
   Design of an Efficient Weighted-Random-Pattern Generation System. [Citation Graph (0, 0)][DBLP]
   ITC, 1994, pp:491-500 [Conf]
   
4. Mary P. Kusko, Bryan J. Robbins, Thomas J. Snethen, Peilin Song, Thomas G. Foote, William V. Huott
   Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip. [Citation Graph (0, 0)][DBLP]
   ITC, 1998, pp:717-726 [Conf]
   
5. Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams
   A weighted random pattern test generation system. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 1996, v:15, n:8, pp:1020-1025 [Journal]