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Publications of Author

1. K. Y. Ko, Mike W. T. Wong
   New built-in self-test technique based on addition/subtraction of selected node voltages. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2000, pp:39-0 [Conf]
   
2. K. Y. Ko, Mike W. T. Wong, Y. S. Lee
   Testing System-On-Chip by Summations of Cores? Test Output Voltages. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2002, pp:350-355 [Conf]
   
3. Joseph C. W. Pang, Mike W. T. Wong, Y. S. Lee
   Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1997, pp:82-87 [Conf]
   
4. Tao Wei, Mike W. T. Wong, Y. S. Lee
   Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1996, pp:232-237 [Conf]
   
5. Mike W. T. Wong
   Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2003, pp:120-123 [Conf]
   
6. Mike W. T. Wong, Matthew Worsman
   DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1998, pp:366-371 [Conf]
   
7. Mike W. T. Wong, Yubin Zhang
   Design and Implementation of Self-Testable Full Range Window Comparator. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2004, pp:314-318 [Conf]
   
8. Matthew Worsman, Mike W. T. Wong, Y. S. Lee
   Analog circuit equivalent faults in the D.C. domain. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2000, pp:84-89 [Conf]
   
9. Mike W. T. Wong, K. Y. Ko, Y. S. Lee
   Analog and Mixed-Signal IP Cores Testing. [Citation Graph (0, 0)][DBLP]
   DELTA, 2002, pp:3-7 [Conf]
   
10. Matthew Worsman, Mike W. T. Wong, Y. S. Lee
    Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis. [Citation Graph (0, 0)][DBLP]
    DELTA, 2002, pp:443-446 [Conf]
    
11. Yingquan Zhou, Mike W. T. Wong, Yinghua Min
    Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers. [Citation Graph (0, 0)][DBLP]
    FTCS, 1995, pp:238-247 [Conf]
    
12. Matthew Worsman, Mike W. T. Wong, Y. S. Lee
    A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality. [Citation Graph (0, 0)][DBLP]
    ISQED, 2000, pp:361-368 [Conf]