Journals in DBLP
Ninoslav Stojadinovic , Michael G. Pecht Editorial. [Citation Graph (0, 0)][DBLP ] Journal ] S. Deleonibus Alternative CMOS or alternative to CMOS? [Citation Graph (0, 0)][DBLP ] Journal ] Joachim N. Burghartz Status and trends of silicon RF technology. [Citation Graph (0, 0)][DBLP ] Journal ] M. Borgarino , Roberto Menozzi , D. Dieci , L. Cattani , Fausto Fantini Reliability physics of compound semiconductor transistors for microwave applications. [Citation Graph (0, 0)][DBLP ] Journal ] Wim Magnus , Wim Schoenmaker On the calculation of gate tunneling currents in ultra-thin metal-insulator-semiconductor capacitors. [Citation Graph (0, 0)][DBLP ] Journal ] Nian Yang , Jimmie J. Wortman A study of the effects of tunneling currents and reliability of sub-2 nm gate oxides on scaled n-MOSFETs. [Citation Graph (0, 0)][DBLP ] Journal ] A. Teramoto , H. Umeda , K. Azamawari , K. Kobayashi , K. Shiga , J. Komori , Y. Ohno , A. Shigetomi Time-dependent dielectric breakdown of SiO2 films in a wide electric field range. [Citation Graph (0, 0)][DBLP ] Journal ] Peter Coppens , Guido Vanhorebeek , Eddy De Backer Correlation between predicted cause of SRAM failures and in-line defect data. [Citation Graph (0, 0)][DBLP ] Journal ] Milan Jevtic , Z. Stanimirovic , I. Stanimirovic Evaluation of thick-film resistor structural parameters based on noise index measurements. [Citation Graph (0, 0)][DBLP ] Journal ] G. Golan , E. Rabinovich , A. Inberg , A. Axelevitch , G. Lubarsky , P. G. Rancoita , M. Demarchi , A. Seidman , N. Croitoru Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors. [Citation Graph (0, 0)][DBLP ] Journal ] Javier Mateos , Tomás González , Daniel Pardo , Virginie Hoel , Alain Cappy Monte Carlo simulation of electronic characteristics in short channel delta-doped AlInAs/GaInAs HEMTs. [Citation Graph (0, 0)][DBLP ] Journal ] H. Ohyama , E. Simoen , S. Kuroda , C. Claeys , Y. Takami , T. Hakata , K. Kobayashi , M. Nakabayashi , H. Sunaga Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle. [Citation Graph (0, 0)][DBLP ] Journal ] B. K. Jones , C. N. Graham , A. Konczakowska , L. Hasse The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs. [Citation Graph (0, 0)][DBLP ] Journal ] Gaetano Ferrante , Dominique Persano Adorno A wavelet analysis of 1/f and white noise in microwave transistors. [Citation Graph (0, 0)][DBLP ] Journal ] X. Y. Chen , A. Pedersen , A. D. van Rheenen Effect of electrical and thermal stress on low-frequency noise characteristics of laser diodes. [Citation Graph (0, 0)][DBLP ] Journal ] H. Oohashi , M. Fukuda , Y. Kondo , M. Yamamoto , Y. Kadota , Y. Kawaguchi , K. Kishi , Y. Tohmori , K. Yokoyama , Y. Itaya Highly reliable spot-size converter integrated laser diodes over a wide temperature range for access network systems. [Citation Graph (0, 0)][DBLP ] Journal ] Chern-Sheng Lin , Li Wen Lue An image system for fast positioning and accuracy inspection of ball grid array boards. [Citation Graph (0, 0)][DBLP ] Journal ] Fuchen Mu , Changhua Tan , Mingzhen Xu Proportional difference estimate method of determining characteristic parameters of normal and log-normal distributions. [Citation Graph (0, 0)][DBLP ] Journal ] Klaus-Willi Pieper , Martin Sauter Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents. [Citation Graph (0, 0)][DBLP ] Journal ] M. M. Shahidul Hassan , A. H. Khandoker New expression for base transit time in a bipolar transistor for all levels of injection. [Citation Graph (0, 0)][DBLP ] Journal ] Milan Jevtic Guidebook for Managing Silicon Chip Reliability; Michael G. Pecht, Riko Radojcic, Gopal Rao. CRC Press LLC, Boca Raton, 1999, 224 pp. ISBN: 0-8493-9624-7. [Citation Graph (0, 0)][DBLP ] Journal ] Ninoslav Stojadinovic Understanding Semiconductor Devices; Sima Dimitrijev. Oxford University Press, New York. 2000. ISBN: 0-19-513186-X. [Citation Graph (0, 0)][DBLP ] Journal ] 