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David Van Campenhout: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Dirk Daneels, David Van Campenhout, Wayne Niblack, William Equitz, Ron Barber, Erwin Bellon, Freddy Fierens
Interactive Outlining: An Improved Approach Using Active Contours. [Citation Graph (3, 0)][DBLP]
Storage and Retrieval for Image and Video Databases (SPIE), 1993, pp:226-233 [Conf] - Cindy Eisner, Dana Fisman, John Havlicek, Yoad Lustig, Anthony McIsaac, David Van Campenhout
Reasoning with Temporal Logic on Truncated Paths. [Citation Graph (0, 0)][DBLP]
CAV, 2003, pp:27-39 [Conf] - David Van Campenhout, Trevor N. Mudge, John P. Hayes
High-Level Test Generation for Design Verification of Pipelined Microprocessors. [Citation Graph (0, 0)][DBLP]
DAC, 1999, pp:185-188 [Conf] - Cindy Eisner, Dana Fisman, John Havlicek, Anthony McIsaac, David Van Campenhout
The Definition of a Temporal Clock Operator. [Citation Graph (0, 0)][DBLP]
ICALP, 2003, pp:857-870 [Conf] - David Van Campenhout, Trevor N. Mudge, Karem A. Sakallah
Timing verification of sequential domino circuits. [Citation Graph (0, 0)][DBLP]
ICCAD, 1996, pp:127-132 [Conf] - David Van Campenhout, Trevor N. Mudge, John P. Hayes
Collection and Analysis of Microprocessor Design Errors. [Citation Graph (0, 0)][DBLP]
IEEE Design & Test of Computers, 2000, v:17, n:4, pp:51-60 [Journal] - David Van Campenhout, Trevor N. Mudge, Karem A. Sakallah
Timing verification of sequential dynamic circuits. [Citation Graph (0, 0)][DBLP]
IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:5, pp:645-658 [Journal] - David Van Campenhout, Hussain Al-Asaad, John P. Hayes, Trevor N. Mudge, Richard B. Brown
High-level design verification of microprocessors via error modeling. [Citation Graph (0, 0)][DBLP]
ACM Trans. Design Autom. Electr. Syst., 1998, v:3, n:4, pp:581-599 [Journal] - James K. Huggins, David Van Campenhout
Specification and verification of pipelining in the ARM2 RISC microprocessor. [Citation Graph (0, 0)][DBLP]
ACM Trans. Design Autom. Electr. Syst., 1998, v:3, n:4, pp:563-580 [Journal]
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