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Publications of Author

1. Hongliang Chang, Vladimir Zolotov, Sambasivan Narayan, Chandu Visweswariah
   Parameterized block-based statistical timing analysis with non-gaussian parameters, nonlinear delay functions. [Citation Graph (0, 0)][DBLP]
   DAC, 2005, pp:71-76 [Conf]
   
2. Chandu Visweswariah
   Death, taxes and failing chips. [Citation Graph (0, 0)][DBLP]
   DAC, 2003, pp:343-347 [Conf]
   
3. Jinjun Xiong, Vladimir Zolotov, Natesan Venkateswaran, Chandu Visweswariah
   Criticality computation in parameterized statistical timing. [Citation Graph (0, 0)][DBLP]
   DAC, 2006, pp:63-68 [Conf]
   
4. Jurjen Westra, Dirk-Jan Jongeneel, Ralph H. J. M. Otten, Chandu Visweswariah
   Time Budgeting in a Wireplanning Context. [Citation Graph (0, 0)][DBLP]
   DATE, 2003, pp:10436-10441 [Conf]
   
5. Matthew R. Guthaus, Natesan Venkateswaran, Chandu Visweswariah, Vladimir Zolotov
   Gate sizing using incremental parameterized statistical timing analysis. [Citation Graph (0, 0)][DBLP]
   ICCAD, 2005, pp:1029-1036 [Conf]
   
6. Chandu Visweswariah
   Statistical analysis and design: from picoseconds to probabilities. [Citation Graph (0, 0)][DBLP]
   SBCCI, 2004, pp:2- [Conf]
   
7. Chandu Visweswariah
   Statistical analysis and optimization in the presence of gate and interconnect delay variations. [Citation Graph (0, 0)][DBLP]
   SLIP, 2006, pp:37- [Conf]
   
8. Chandu Visweswariah
   Fear, uncertainty and statistics. [Citation Graph (0, 0)][DBLP]
   ISPD, 2007, pp:169- [Conf]
   
9. 
   Static timing: Back to our roots. [Citation Graph (, )][DBLP]
   
   
10. 
    A moment-based effective characterization waveform for static timing analysis. [Citation Graph (, )][DBLP]
    
    
11. 
    Statistical ordering of correlated timing quantities and its application for path ranking. [Citation Graph (, )][DBLP]
    
    
12. 
    Statistical multilayer process space coverage for at-speed test. [Citation Graph (, )][DBLP]
    
    
13. 
    Transistor sizing of custom high-performance digital circuits with parametric yield considerations. [Citation Graph (, )][DBLP]
    
    
14. 
    Incremental Criticality and Yield Gradients. [Citation Graph (, )][DBLP]
    
    
15. 
    Optimal Margin Computation for At-Speed Test. [Citation Graph (, )][DBLP]
    
    
16. 
    Variation-aware performance verification using at-speed structural test and statistical timing. [Citation Graph (, )][DBLP]
    
    
17. 
    Compact modeling of variational waveforms. [Citation Graph (, )][DBLP]
    
    
18. 
    Statistical path selection for at-speed test. [Citation Graph (, )][DBLP]
    
    
19. 
    Voltage binning under process variation. [Citation Graph (, )][DBLP]
    
    
20. 
    Pre-ATPG path selection for near optimal post-ATPG process space coverage. [Citation Graph (, )][DBLP]
    
    
21. 
    Plenary Speech 2P2: Statistical Techniques to Achieve Robustness and Quality. [Citation Graph (, )][DBLP]
    
    
22. 
    A New Methodology for Power-Aware Transistor Sizing: Free Power Recovery (FPR). [Citation Graph (, )][DBLP]
    
    
23. 
    Statistical Modeling and Analysis of Static Leakage and Dynamic Switching Power. [Citation Graph (, )][DBLP]