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Publications of Author

1. Von-Kyoung Kim, Tom Chen, Mick Tegethoff
   Fault Coverage Estimation for Early Stage of VLSI Design. [Citation Graph (0, 0)][DBLP]
   Great Lakes Symposium on VLSI, 1999, pp:105-108 [Conf]
   
2. Felix Frayman, Mick Tegethoff, Brenton White
   Issues in Optimizing the Test Process - A Telecom Case Study. [Citation Graph (0, 0)][DBLP]
   ITC, 1996, pp:800-808 [Conf]
   
3. Brion L. Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane
   An Economic Analysis and ROI Model for Nanometer Test. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:518-524 [Conf]
   
4. Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir
   A new methodology for improved tester utilization. [Citation Graph (0, 0)][DBLP]
   ITC, 2001, pp:916-923 [Conf]
   
5. Von-Kyoung Kim, Tom Chen, Mick Tegethoff
   ASIC Manufacturing Test Cost Prediction at Early Design Stage. [Citation Graph (0, 0)][DBLP]
   ITC, 1997, pp:356-361 [Conf]
   
6. Von-Kyoung Kim, Mick Tegethoff, Tom Chen
   ASIC Yield Estimation at Early Design Cycle. [Citation Graph (0, 0)][DBLP]
   ITC, 1996, pp:590-594 [Conf]
   
7. Mick Tegethoff
   IEEE 1149.1: How to Justify Implementation. [Citation Graph (0, 0)][DBLP]
   ITC, 1993, pp:265- [Conf]
   
8. Mick Tegethoff, Tom Chen
   Defects, Fault Coverage, Yield and Cost in Board Manufacturing. [Citation Graph (0, 0)][DBLP]
   ITC, 1994, pp:539-547 [Conf]
   
9. Mick Tegethoff, Tom Chen
   Manufacturing-Test Simulator: A Concurrent-Engineering Tool for Boards and MCMs. [Citation Graph (0, 0)][DBLP]
   ITC, 1994, pp:903-910 [Conf]
   
10. Mick Tegethoff, T. E. Figal, S. W. Hird
    Board Test DFT Model for Computer Products. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:367-371 [Conf]
    
11. Mick Tegethoff, Kenneth P. Parker, Ken Lee
    Opens Board Test Coverage: When is 99% Really 40%? [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:333-339 [Conf]
    
12. Mick Tegethoff, Tom Chen
    Sensitivity Analysis of Critical Parameters in Board Test. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:1, pp:58-63 [Journal]
    
13. Mick Tegethoff, Kenneth P. Parker
    IEEE Std 1149.1: Where Are We? Where From Here? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1995, v:12, n:2, pp:53-59 [Journal]