Journals in DBLP

J. Electronic Testing
2005, volume: 21, number: 6

1. Vishwani D. Agrawal
   Editorial. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:6, pp:567- [Journal]
   
2. Jee-Youl Ryu, Bruce C. Kim
   Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:6, pp:571-581 [Journal]
   
3. Y. Lechuga, R. Mozuelos, M. A. Allende, Mar Martínez, Salvador Bracho
   Fault Detection in Switched Current Circuits Using Built-in Transient Current Sensors. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:6, pp:583-598 [Journal]
   
4. Julien Pouget, Erik Larsson, Zebo Peng
   Multiple-Constraint Driven System-on-Chip Test Time Optimization. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:6, pp:599-611 [Journal]
   
5. Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita
   Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:6, pp:613-620 [Journal]
   
6. Baosheng Wang, Andy Kuo, Touraj Farahmand, André Ivanov, Yong B. Cho, Sassan Tabatabaei
   A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:6, pp:621-630 [Journal]
   
7. Joonhwan Yi, John P. Hayes
   The Coupling Model for Function and Delay Faults. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:6, pp:631-649 [Journal]
   
8. Erik Larsson, Julien Pouget, Zebo Peng
   Abort-on-Fail Based Test Scheduling. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:6, pp:651-658 [Journal]