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Bruce C. Kim: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Kranthi K. Pinjala, Bruce C. Kim
    An Approach for Selection of Test Points for Analog Fault Diagnosis. [Citation Graph (0, 0)][DBLP]
    DFT, 2003, pp:287-294 [Conf]
  2. Rahim Kasim, Bruce C. Kim, Josef Drobnik
    Advanced Mems for High Power Integrated Distribution Systems. [Citation Graph (0, 0)][DBLP]
    ICMENS, 2005, pp:247-254 [Conf]
  3. Kee-Keun Lee, Jiping He, Amarjit Singh, Bruce C. Kim
    Benzocyclobutene (BCB) Based Intracortical Neural Implant. [Citation Graph (0, 0)][DBLP]
    ICMENS, 2003, pp:418-422 [Conf]
  4. Kee-Keun Lee, Bruce C. Kim
    RF MEMS Switch for Wireless LAN Applications. [Citation Graph (0, 0)][DBLP]
    ICMENS, 2003, pp:100-102 [Conf]
  5. Kee-Keun Lee, Bruce C. Kim
    MEMS Spring Probe for Next Generation Wafer Level Testing. [Citation Graph (0, 0)][DBLP]
    ICMENS, 2003, pp:214-217 [Conf]
  6. Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel
    A Novel Low-Cost Approach to MCM Interconnect Test. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:184-192 [Conf]
  7. Bruce C. Kim, Pinshan Jiang, Se Hyun Park
    A probe scheduling algorithm for MCM substrates. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:31-37 [Conf]
  8. Bruce C. Kim, David C. Keezer, Abhijit Chatterjee
    A high throughput test methodology for MCM substrates. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:234-0 [Conf]
  9. Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam
    Automatic Diagnostic Program Generation for Mixed Signal Load Board. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:403-409 [Conf]
  10. Paul J. Bond, Bruce C. Kim, Christopher A. Lee, David E. Schimmel
    A Methodology for Generation and Collection of Multiprocessor Traces. [Citation Graph (0, 0)][DBLP]
    MASCOTS, 1994, pp:417-418 [Conf]
  11. Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi
    Low-cost DC built-in self-test of linear analog circuits using checksums. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1996, pp:230-233 [Conf]
  12. Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan
    Low-cost diagnosis of defects in MCM substrate interconnections. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:260-265 [Conf]
  13. Bruce C. Kim, Krishna Marella
    A Novel Test Methodology for MEMS Magnetic Micromotors. [Citation Graph (0, 0)][DBLP]
    VTS, 1999, pp:284-289 [Conf]
  14. Rongchang Yan, Bruce C. Kim
    A Novel Routing Algorithm for MCM Substrate Verification Using Single-Ended Prob. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:266-273 [Conf]
  15. Yervant Zorian, Bruce C. Kim
    Session Abstract. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:334-335 [Conf]
  16. Bruce C. Kim
    Test Technology Technical Council Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:250- [Journal]
  17. Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi
    DC Built-In Self-Test for Linear Analog Circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:2, pp:26-33 [Journal]
  18. Bruce C. Kim
    Test Technology TC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:4, pp:320-323 [Journal]
  19. Bruce C. Kim
    Test Technology TC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:5, pp:425- [Journal]
  20. Bruce C. Kim, Yervant Zorian
    Guest Editors' Introduction: Big Innovations in Small Packages. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:186-187 [Journal]
  21. Jee-Youl Ryu, Bruce C. Kim
    Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:8, pp:770-777 [Journal]
  22. Jee-Youl Ryu, Bruce C. Kim
    Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:6, pp:571-581 [Journal]
  23. Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla
    A Novel RF Test Scheme Based on a DFT Method. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:3, pp:229-237 [Journal]
  24. Bruce C. Kim
    Test Technology Technical Council Newsletter. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:2, pp:113-114 [Journal]
  25. Bruce C. Kim
    Test Technology Technical Council Newsletter. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:3, pp:201- [Journal]
  26. Bruce C. Kim
    The Newsletter of Test Technology Council of the IEEE Computer Society. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:5, pp:461-462 [Journal]
  27. Bruce C. Kim
    Test Technology Newsletter. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2007, v:23, n:1, pp:9-10 [Journal]

  28. TTTC Newsletter. [Citation Graph (, )][DBLP]


  29. TTTC Newsletter. [Citation Graph (, )][DBLP]


  30. TTTC Newsletter. [Citation Graph (, )][DBLP]


  31. TTTC Newsletter. [Citation Graph (, )][DBLP]


  32. Test Technology TC Newsletter. [Citation Graph (, )][DBLP]


  33. TTTC Newsletter. [Citation Graph (, )][DBLP]


  34. TTTC Newsletter. [Citation Graph (, )][DBLP]


  35. TTTC Newsletter. [Citation Graph (, )][DBLP]


  36. Guest Editors' Introduction: The Evolution of RFIC Design and Test. [Citation Graph (, )][DBLP]


  37. TTTC Newsletter. [Citation Graph (, )][DBLP]


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