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Enamul Amyeen: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee
    Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:669-678 [Conf]
  2. Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Enamul Amyeen
    Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2004, pp:475-480 [Conf]
  3. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana
    Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:124-130 [Conf]
  4. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana
    Implication and Evaluation Techniques for Proving Fault Equivalence. [Citation Graph (0, 0)][DBLP]
    VTS, 1999, pp:201-213 [Conf]
  5. Enamul Amyeen, Irith Pomeranz, W. Kent Fuchs
    Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:181-186 [Conf]
  6. Ruifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman
    Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:66-71 [Conf]
  7. Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen, Sudhakar M. Reddy
    Dominance Based Analysis for Large Volume Production Fail Diagnosis. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:392-399 [Conf]
  8. Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo
    An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:23-30 [Conf]
  9. Xiaoming Yu, Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz
    Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:351-358 [Conf]
  10. Vishnu C. Vimjam, M. Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang
    Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:231-238 [Conf]
  11. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana
    Fault equivalence identification in combinational circuits using implication and evaluation techniques. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:7, pp:922-936 [Journal]

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