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Publications of Author

1. M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee
   Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:669-678 [Conf]
   
2. Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Enamul Amyeen
   Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2004, pp:475-480 [Conf]
   
3. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana
   Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction. [Citation Graph (0, 0)][DBLP]
   VTS, 2001, pp:124-130 [Conf]
   
4. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana
   Implication and Evaluation Techniques for Proving Fault Equivalence. [Citation Graph (0, 0)][DBLP]
   VTS, 1999, pp:201-213 [Conf]
   
5. Enamul Amyeen, Irith Pomeranz, W. Kent Fuchs
   Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits. [Citation Graph (0, 0)][DBLP]
   VTS, 2002, pp:181-186 [Conf]
   
6. Ruifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman
   Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. [Citation Graph (0, 0)][DBLP]
   VTS, 2006, pp:66-71 [Conf]
   
7. Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen, Sudhakar M. Reddy
   Dominance Based Analysis for Large Volume Production Fail Diagnosis. [Citation Graph (0, 0)][DBLP]
   VTS, 2006, pp:392-399 [Conf]
   
8. Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo
   An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. [Citation Graph (0, 0)][DBLP]
   VTS, 2004, pp:23-30 [Conf]
   
9. Xiaoming Yu, Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz
   Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. [Citation Graph (0, 0)][DBLP]
   VTS, 2003, pp:351-358 [Conf]
   
10. Vishnu C. Vimjam, M. Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang
    Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:231-238 [Conf]
    
11. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana
    Fault equivalence identification in combinational circuits using implication and evaluation techniques. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:7, pp:922-936 [Journal]