Journals in DBLP
Vishwani D. Agrawal Editorial. [Citation Graph (0, 0)][DBLP ] Journal ] Bruce C. Kim Test Technology Newsletter. [Citation Graph (0, 0)][DBLP ] Journal ] Chunsheng Liu Improve the Quality of Per-Test Fault Diagnosis Using Output Information. [Citation Graph (0, 0)][DBLP ] Journal ] Ugur Çilingiroglu Magnetic In-circuit Testing of Multiple Power and Ground Pins for Open Faults. [Citation Graph (0, 0)][DBLP ] Journal ] Grzegorz Mrugalski , Janusz Rajski , Chen Wang , Artur Pogiel , Jerzy Tyszer Isolation of Failing Scan Cells through Convolutional Test Response Compaction. [Citation Graph (0, 0)][DBLP ] Journal ] Luca Sterpone , Matteo Sonza Reorda , Massimo Violante , Fernanda Lima Kastensmidt , Luigi Carro Evaluating Different Solutions to Design Fault Tolerant Systems with SRAM-based FPGAs. [Citation Graph (0, 0)][DBLP ] Journal ] Gurgen Harutunyan , Valery A. Vardanian , Yervant Zorian Minimal March Tests for Detection of Dynamic Faults in Random Access Memories. [Citation Graph (0, 0)][DBLP ] Journal ] Wang-Dauh Tseng Generation of Primary Input Blocking Pattern for Power Minimization during Scan Testing. [Citation Graph (0, 0)][DBLP ] Journal ] Dana Brown , John Ferrario , Randy Wolf , Jing Li , Jayendra Bhagat , Mustapha Slamani RF Testing on a Mixed Signal Tester. [Citation Graph (0, 0)][DBLP ] Journal ] Shalabh Goyal , Abhijit Chatterjee , Michael Purtell A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. [Citation Graph (0, 0)][DBLP ] Journal ] 