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Charles R. Kime: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Ramachendra P. Batni, Jeffrey D. Russell, Charles R. Kime
    An Efficient Algorithm for Finding an Irredundant Set Cover. [Citation Graph (1, 0)][DBLP]
    J. ACM, 1974, v:21, n:3, pp:351-355 [Journal]
  2. Kee Sup Kim, Charles R. Kime
    Partial Scan by Use of Empirical Testability. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1990, pp:314-317 [Conf]
  3. Vincent C. Rideout, J. Eastman, Adel Said Elmaghraby, Raphael A. Finkel, A. A. Frank, T. J. Kaminsky, Charles R. Kime, John A. McPherson, Michael Jon Redmond, S. Diane Smith
    WISPAC: A Parallel Array Computer for Simulation Applications. [Citation Graph (0, 0)][DBLP]
    IMACS World Congress, 1982, pp:159-169 [Conf]
  4. Mohammed F. AlShaibi, Charles R. Kime
    Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:929-938 [Conf]
  5. Mohammed F. AlShaibi, Charles R. Kime
    MFBIST: A BIST Method for Random Pattern Resistant Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:176-185 [Conf]
  6. Gary L. Craig, Charles R. Kime
    Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. [Citation Graph (0, 0)][DBLP]
    ITC, 1985, pp:126-139 [Conf]
  7. Kee Sup Kim, Charles R. Kime
    Partial Scan Using Reverse Direction Empirical Testability. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:498-506 [Conf]
  8. Charles R. Kime
    Impact of Testability Standards on University Research and Instruction. [Citation Graph (0, 0)][DBLP]
    ITC, 1988, pp:199-200 [Conf]
  9. Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams
    A Built-In Test Methodology for VLSI Data Paths. [Citation Graph (0, 0)][DBLP]
    ITC, 1984, pp:327-337 [Conf]
  10. Danial J. Neebel, Charles R. Kime
    Inhomogeneous Cellular Automata for Weighted-Random-Pattern Generation. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:1013-1022 [Conf]
  11. John Y. Sayah, Charles R. Kime
    : Test Scheduling for High Performance VLSI System Implementations. [Citation Graph (0, 0)][DBLP]
    ITC, 1988, pp:421-430 [Conf]
  12. Leon J. Sigal, Charles R. Kime
    Concurrent Off-Phase Built-in Self-Test of Dormant Logic. [Citation Graph (0, 0)][DBLP]
    ITC, 1988, pp:934-941 [Conf]
  13. Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja
    A Tutorial on Built-in Self-Test. I. Principles. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:1, pp:73-82 [Journal]
  14. Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja
    A Tutorial on Built-In Self-Test, Part 2: Applications. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:2, pp:69-77 [Journal]
  15. Ramachendra P. Batni, Charles R. Kime
    A Module-Level Testing Approach for Combinational Networks. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1976, v:25, n:6, pp:594-604 [Journal]
  16. Gary L. Craig, Charles R. Kime, Kewal K. Saluja
    Test Scheduling and Control for VLSI Built-In Self-Test. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1988, v:37, n:9, pp:1099-1109 [Journal]
  17. Charles R. Kime
    Fault Tolerant Computing: An Introduction and a Perspective. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1975, v:24, n:5, pp:457-460 [Journal]
  18. Charles R. Kime
    An Abstract Model for Digital System Fault Diagnosis. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1979, v:28, n:10, pp:754-767 [Journal]
  19. John A. McPherson, Charles R. Kime
    A Two-Level Diagnostic Model for Digital Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1979, v:28, n:1, pp:16-27 [Journal]
  20. John A. McPherson, Charles R. Kime
    Diagnosis in the Presence of Known Faults. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:10, pp:943-947 [Journal]
  21. Gernot Metze, Donald R. Schertz, Kilin To, Gordon Whitney, Charles R. Kime, Jeffrey D. Russell
    Comments on ``Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1975, v:24, n:1, pp:108- [Journal]
  22. Danial J. Neebel, Charles R. Kime
    Cellular Automata for Weighted Random Pattern Generation. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1997, v:46, n:11, pp:1219-1229 [Journal]
  23. Jeffrey D. Russell, Charles R. Kime
    System Fault Diagnosis: Masking, Exposure, and Diagnosability Without Repair. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1975, v:24, n:12, pp:1155-1161 [Journal]
  24. Jeffrey D. Russell, Charles R. Kime
    System Fault Diagnosis: Closure and Diagnosability with Repair. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1975, v:24, n:11, pp:1078-1089 [Journal]
  25. John Y. Sayah, Charles R. Kime
    Test Scheduling in High Performance VLSI System Implementations. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1992, v:41, n:1, pp:52-67 [Journal]
  26. Kewal K. Saluja, Rajiv Sharma, Charles R. Kime
    A concurrent testing technique for digital circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1988, v:7, n:12, pp:1250-1260 [Journal]

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