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Kee Sup Kim: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Kee Sup Kim, Rathish Jayabharathi, Craig Carstens
SpeedGrade: An RTL Path Delay Fault Simulator. [Citation Graph (0, 0)][DBLP]
Asian Test Symposium, 2001, pp:239-243 [Conf] - Nic Mokhoff, Yervant Zorian, Kamalesh N. Ruparel, Hao Nham, Francesco Pessolano, Kee Sup Kim
How to determine the necessity for emerging solutions. [Citation Graph (0, 0)][DBLP]
DAC, 2005, pp:274-275 [Conf] - Kee Sup Kim, Charles R. Kime
Partial Scan by Use of Empirical Testability. [Citation Graph (0, 0)][DBLP]
ICCAD, 1990, pp:314-317 [Conf] - Subhasish Mitra, Kee Sup Kim
XMAX: X-Tolerant Architecture for MAXimal Test Compression. [Citation Graph (0, 0)][DBLP]
ICCD, 2003, pp:326-330 [Conf] - Kee Sup Kim, Rathish Jayabharathi, Craig Carstens, Praveen Vishakantaiah, Derek Feltham, Adrian Carbine
DPDAT: data path direct access testing. [Citation Graph (0, 0)][DBLP]
ITC, 2001, pp:188-195 [Conf] - Kee Sup Kim, Charles R. Kime
Partial Scan Using Reverse Direction Empirical Testability. [Citation Graph (0, 0)][DBLP]
ITC, 1993, pp:498-506 [Conf] - Kee Sup Kim, Len Schultz
Multi-Frequency, Multi-Phase Scan Chain. [Citation Graph (0, 0)][DBLP]
ITC, 1994, pp:323-330 [Conf] - Subhasish Mitra, Kee Sup Kim
X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction. [Citation Graph (0, 0)][DBLP]
ITC, 2002, pp:311-320 [Conf] - David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish
H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. [Citation Graph (0, 0)][DBLP]
ITC, 2003, pp:1229-1238 [Conf] - Kee Sup Kim, Mohammad Tehranipoor
Session Abstract. [Citation Graph (0, 0)][DBLP]
VTS, 2006, pp:292-293 [Conf] - Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim
Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim. [Citation Graph (0, 0)][DBLP]
IEEE Computer, 2005, v:38, n:2, pp:43-52 [Journal] - Kee Sup Kim, Subhasish Mitra, Paul G. Ryan
Delay Defect Characteristics and Testing Strategies. [Citation Graph (0, 0)][DBLP]
IEEE Design & Test of Computers, 2003, v:20, n:5, pp:8-16 [Journal] - Subhasish Mitra, Kee Sup Kim
XPAND: An Efficient Test Stimulus Compression Technique. [Citation Graph (0, 0)][DBLP]
IEEE Trans. Computers, 2006, v:55, n:2, pp:163-173 [Journal] - Subhasish Mitra, Kee Sup Kim
X-compact: an efficient response compaction technique. [Citation Graph (0, 0)][DBLP]
IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:3, pp:421-432 [Journal] - Ming Zhang, T. M. Mak, James Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu
Design for Resilience to Soft Errors and Variations. [Citation Graph (0, 0)][DBLP]
IOLTS, 2007, pp:23-28 [Conf] - Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim
Soft Error Resilient System Design through Error Correction. [Citation Graph (0, 0)][DBLP]
VLSI-SoC, 2006, pp:332-337 [Conf] - Ming Zhang, Subhasish Mitra, T. M. Mak, Norbert Seifert, N. J. Wang, Quan Shi, Kee Sup Kim, Naresh R. Shanbhag, S. J. Patel
Sequential Element Design With Built-In Soft Error Resilience. [Citation Graph (0, 0)][DBLP]
IEEE Trans. VLSI Syst., 2006, v:14, n:12, pp:1368-1378 [Journal]
Hierarchical Test Compression for SoC Designs. [Citation Graph (, )][DBLP]
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