|
Search the dblp DataBase
Chi-Feng Wu:
[Publications]
[Author Rank by year]
[Co-authors]
[Prefers]
[Cites]
[Cited by]
Publications of Author
- Chi-Feng Wu, Cheng-Wen Wu
Testing Interconnects of Dynamic Reconfigurable FPGAs. [Citation Graph (0, 0)][DBLP] ASP-DAC, 1999, pp:279-282 [Conf]
- Kwang-Ting Cheng, Vishwani D. Agrawal, Jing-Yang Jou, Li-C. Wang, Chi-Feng Wu, Shianling Wu
Collaboration between Industry and Academia in Test Research. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2000, pp:17-0 [Conf]
- Chih-Wea Wang, Ruey-Shing Tzeng, Chi-Feng Wu, Chih-Tsun Huang, Cheng-Wen Wu, Shi-Yu Huang, Shyh-Horng Lin, Hsin-Po Wang
A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2001, pp:103-0 [Conf]
- Chih-Wea Wang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu, Tony Teng, Kevin Chiu, Hsiao-Ping Lin
A built-in self-test and self-diagnosis scheme for embedded SRAM. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2000, pp:45-50 [Conf]
- Chi-Feng Wu, Chih-Tsun Huang, Kuo-Liang Cheng, Chih-Wea Wang, Cheng-Wen Wu
Simulation-Based Test Algorithm Generation and Port Scheduling for Multi-Port Memories. [Citation Graph (0, 0)][DBLP] DAC, 2001, pp:301-306 [Conf]
- Jen-Chieh Yeh, Chi-Feng Wu, Kuo-Liang Cheng, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu
Flash Memory Built-In Self-Test Using March-Like Algorithm. [Citation Graph (0, 0)][DBLP] DELTA, 2002, pp:137-141 [Conf]
- Chi-Feng Wu, Chih-Tsun Huang, Cheng-Wen Wu
RAMSES: A Fast Memory Fault Simulator. [Citation Graph (0, 0)][DBLP] DFT, 1999, pp:165-173 [Conf]
- Chi-Feng Wu, Chih-Tsun Huang, Chih-Wea Wang, Kuo-Liang Cheng, Cheng-Wen Wu
Error Catch and Analysis for Semiconductor Memories Using March Tests. [Citation Graph (0, 0)][DBLP] ICCAD, 2000, pp:468-471 [Conf]
- Chi-Feng Wu, Chih-Tsun Huang, Kuo-Liang Cheng, Cheng-Wen Wu
Simulation-Based Test Algorithm Generation for Random Access Memories. [Citation Graph (0, 0)][DBLP] VTS, 2000, pp:291-296 [Conf]
- Chenn-Jung Huang, Chua-Chin Wang, Chi-Feng Wu
Image Processing Techniques for Wafer Defect Cluster Identification. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2002, v:19, n:2, pp:44-48 [Journal]
- Chih-Tsun Huang, Jing-Reng Huang, Chi-Feng Wu, Cheng-Wen Wu, Tsin-Yuan Chang
A Programmable BIST Core for Embedded DRAM. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1999, v:16, n:1, pp:59-70 [Journal]
- Chi-Feng Wu, Chih-Tsun Huang, Kuo-Liang Cheng, Cheng-Wen Wu
Fault simulation and test algorithm generation for random accessmemories. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:4, pp:480-490 [Journal]
- Hsiao-Hwa Chen, Jin-Xiao Lin, Shin-Wei Chu, Chi-Feng Wu, Guo-Sheng Chen
Isotropic air-interface technologies for fourth generation wireless communications. [Citation Graph (0, 0)][DBLP] Wireless Communications and Mobile Computing, 2003, v:3, n:6, pp:687-704 [Journal]
- Chih-Tsun Huang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu
Built-in redundancy analysis for memory yield improvement. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2003, v:52, n:4, pp:386-399 [Journal]
Application of neural networks and genetic algorithms to the screening for high quality chips. [Citation Graph (, )][DBLP]
Search in 0.003secs, Finished in 0.003secs
|