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Jennifer Dworak: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer
    On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2000, pp:151-0 [Conf]
  2. Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
    Enhancing test efficiency for delay fault testing using multiple-clocked schemes. [Citation Graph (0, 0)][DBLP]
    DAC, 2002, pp:371-374 [Conf]
  3. Vladimir Stojanovic, R. Iris Bahar, Jennifer Dworak, Richard Weiss
    A cost-effective implementation of an ECC-protected instruction queue for out-of-order microprocessors. [Citation Graph (0, 0)][DBLP]
    DAC, 2006, pp:705-708 [Conf]
  4. Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer
    Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:1066-1071 [Conf]
  5. Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael R. Grimaila, M. Ray Mercer
    A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults. [Citation Graph (0, 0)][DBLP]
    DATE, 2002, pp:94-101 [Conf]
  6. Jennifer Dworak, James Wingfield, Brad Cobb, Sooryong Lee, Li-C. Wang, M. Ray Mercer
    Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. [Citation Graph (0, 0)][DBLP]
    DFT, 2002, pp:177-185 [Conf]
  7. Jennifer Dworak, James Wingfield, M. Ray Mercer
    A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects. [Citation Graph (0, 0)][DBLP]
    DFT, 2004, pp:460-468 [Conf]
  8. James Wingfield, Jennifer Dworak, M. Ray Mercer
    Function-Based Dynamic Compaction and its Impact on Test Set Sizes. [Citation Graph (0, 0)][DBLP]
    DFT, 2003, pp:167-174 [Conf]
  9. Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer
    Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:930-939 [Conf]
  10. Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer
    Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:1031-1037 [Conf]
  11. Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
    Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:407-416 [Conf]
  12. Jennifer Dworak
    An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects. [Citation Graph (0, 0)][DBLP]
    MTV, 2005, pp:48-54 [Conf]
  13. Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer
    Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:9-15 [Conf]
  14. Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer
    REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. [Citation Graph (0, 0)][DBLP]
    VTS, 1999, pp:268-274 [Conf]
  15. Jennifer Dworak
    An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:205-210 [Conf]
  16. Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang
    Defect-Oriented Testing and Defective-Part-Level Prediction. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2001, v:18, n:1, pp:31-41 [Journal]

  17. Detecting errors using multi-cycle invariance information. [Citation Graph (, )][DBLP]


  18. NIM- a noise index model to estimate delay discrepancies between silicon and simulation. [Citation Graph (, )][DBLP]


  19. Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization. [Citation Graph (, )][DBLP]


  20. Improving the testability and reliability of sequential circuits with invariant logic. [Citation Graph (, )][DBLP]


  21. Compacting test vector sets via strategic use of implications. [Citation Graph (, )][DBLP]


  22. Reducing Scan Shift Power at RTL. [Citation Graph (, )][DBLP]


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