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Publications of Author

1. Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer
   On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2000, pp:151-0 [Conf]
   
2. Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
   Enhancing test efficiency for delay fault testing using multiple-clocked schemes. [Citation Graph (0, 0)][DBLP]
   DAC, 2002, pp:371-374 [Conf]
   
3. Vladimir Stojanovic, R. Iris Bahar, Jennifer Dworak, Richard Weiss
   A cost-effective implementation of an ECC-protected instruction queue for out-of-order microprocessors. [Citation Graph (0, 0)][DBLP]
   DAC, 2006, pp:705-708 [Conf]
   
4. Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer
   Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. [Citation Graph (0, 0)][DBLP]
   DATE, 2004, pp:1066-1071 [Conf]
   
5. Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael R. Grimaila, M. Ray Mercer
   A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults. [Citation Graph (0, 0)][DBLP]
   DATE, 2002, pp:94-101 [Conf]
   
6. Jennifer Dworak, James Wingfield, Brad Cobb, Sooryong Lee, Li-C. Wang, M. Ray Mercer
   Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. [Citation Graph (0, 0)][DBLP]
   DFT, 2002, pp:177-185 [Conf]
   
7. Jennifer Dworak, James Wingfield, M. Ray Mercer
   A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects. [Citation Graph (0, 0)][DBLP]
   DFT, 2004, pp:460-468 [Conf]
   
8. James Wingfield, Jennifer Dworak, M. Ray Mercer
   Function-Based Dynamic Compaction and its Impact on Test Set Sizes. [Citation Graph (0, 0)][DBLP]
   DFT, 2003, pp:167-174 [Conf]
   
9. Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer
   Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. [Citation Graph (0, 0)][DBLP]
   ITC, 2000, pp:930-939 [Conf]
   
10. Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer
    Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:1031-1037 [Conf]
    
11. Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
    Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:407-416 [Conf]
    
12. Jennifer Dworak
    An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects. [Citation Graph (0, 0)][DBLP]
    MTV, 2005, pp:48-54 [Conf]
    
13. Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer
    Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:9-15 [Conf]
    
14. Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer
    REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. [Citation Graph (0, 0)][DBLP]
    VTS, 1999, pp:268-274 [Conf]
    
15. Jennifer Dworak
    An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:205-210 [Conf]
    
16. Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang
    Defect-Oriented Testing and Defective-Part-Level Prediction. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2001, v:18, n:1, pp:31-41 [Journal]
    
17. 
    Detecting errors using multi-cycle invariance information. [Citation Graph (, )][DBLP]
    
    
18. 
    NIM- a noise index model to estimate delay discrepancies between silicon and simulation. [Citation Graph (, )][DBLP]
    
    
19. 
    Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization. [Citation Graph (, )][DBLP]
    
    
20. 
    Improving the testability and reliability of sequential circuits with invariant logic. [Citation Graph (, )][DBLP]
    
    
21. 
    Compacting test vector sets via strategic use of implications. [Citation Graph (, )][DBLP]
    
    
22. 
    Reducing Scan Shift Power at RTL. [Citation Graph (, )][DBLP]