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Author:
Bernard Courtois: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri
    Panel: New Research Problems in the Emerging Test Technology. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:189-0 [Conf]
  2. Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois
    Thermal Monitoring Of Safety-Critical Integrated Systems. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1996, pp:282-288 [Conf]
  3. Ahmed Amine Jerraya, P. Varinot, R. Jamier, Bernard Courtois
    Principles of the SYCO compiler. [Citation Graph (0, 0)][DBLP]
    DAC, 1986, pp:715-721 [Conf]
  4. Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, A. Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
    CAD and Foundries for Microsystems. [Citation Graph (0, 0)][DBLP]
    DAC, 1997, pp:674-679 [Conf]
  5. Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois
    Microsystems Testing: an Approach and Open Problems. [Citation Graph (0, 0)][DBLP]
    DATE, 1998, pp:524-0 [Conf]
  6. Bernard Courtois
    Infrastructures for Education, Research and Industry in Microelectronics - A review. [Citation Graph (0, 0)][DBLP]
    DELTA, 2004, pp:149-156 [Conf]
  7. Salvador Mir, Benoît Charlot, Gabriela Nicolescu, P. Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz
    Towards design and validation of mixed-technology SOCs. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2000, pp:29-33 [Conf]
  8. Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois
    Built-In Self-Test for Multi-Port RAMs. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1991, pp:248-251 [Conf]
  9. Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois
    Built-in self-test and fault diagnosis of fully differential analogue circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1994, pp:486-490 [Conf]
  10. F. L. Vargas, Michael Nicolaidis, Bernard Courtois
    Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. [Citation Graph (0, 0)][DBLP]
    ICCD, 1993, pp:596-600 [Conf]
  11. H. Sahami, Bernard Courtois
    Functional testing vs. structural testing of RAMs. [Citation Graph (0, 0)][DBLP]
    Fehlertolerierende Rechensysteme, 1984, pp:391-403 [Conf]
  12. S. J. Abou-Samra, P. A. Aisa, Alain Guyot, Bernard Courtois
    3D CMOS SOL for high performance computing. [Citation Graph (0, 0)][DBLP]
    ISLPED, 1998, pp:54-58 [Conf]
  13. Jean Paul Caisso, Bernard Courtois
    Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. [Citation Graph (0, 0)][DBLP]
    ITC, 1988, pp:94-101 [Conf]
  14. A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois
    Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:541-550 [Conf]
  15. Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois
    Fault modeling of suspended thermal MEMS. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:319-328 [Conf]
  16. Bernard Courtois
    Analytical Testing of Data Processing Sections of Integrated CPUs. [Citation Graph (0, 0)][DBLP]
    ITC, 1981, pp:21-30 [Conf]
  17. Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski
    Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:120-129 [Conf]
  18. J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin
    Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1986, pp:465-473 [Conf]
  19. Marcelo Lubaszewski, Bernard Courtois
    On the Design of Self-Checking Boundary Scannable Boards. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:372-381 [Conf]
  20. M. Marzouki, J. Laurent, Bernard Courtois
    Coupling Electron-Beam Probing with Knowledge-Based Fault Localization. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:238-247 [Conf]
  21. Kholdoun Torki, Bernard Courtois
    CMP: The Access to Advanced Low Costy Manufacturing. [Citation Graph (0, 0)][DBLP]
    MSE, 2001, pp:6-0 [Conf]
  22. Kholdoun Torki, Bernard Courtois
    Advanced Low Cost Manufacturing From CMP Service. [Citation Graph (0, 0)][DBLP]
    MSE, 1999, pp:4-5 [Conf]
  23. Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
    Design and Test of MEMs. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1999, pp:270-0 [Conf]
  24. Salvador Mir, Libor Rufer, Bernard Courtois
    On-chip testing of embedded transducers. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2004, pp:463-0 [Conf]
  25. Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois
    Electrically Induced Stimuli For MEMS Self-Test. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:210-217 [Conf]
  26. Bernard Courtois
    Session Abstract. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:150-151 [Conf]
  27. Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski
    Frequency-based BIST for analog circuit testin. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:54-59 [Conf]
  28. Vladimir Székely, Márta Rencz, Bernard Courtois
    Integrating on-chip temperature sensors into DfT schemes and BIST architectures. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:440-445 [Conf]
  29. Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois
    Conference Reports. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1995, v:12, n:4, pp:95-97 [Journal]
  30. Bernard Courtois
    Second Therminic Workshop. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:4, pp:5-0 [Journal]
  31. Bernard Courtois, R. D. (Shawn) Blanton
    Guest Editors' Introduction. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:16-17 [Journal]
  32. Bozena Kaminska, Bernard Courtois
    Guest Editors' Introduction: Mixed Analog and Digital Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:2, pp:8-9 [Journal]
  33. Jean-Michel Karam, Bernard Courtois, Hicham Boutamine
    CAD Tools for Bridging Microsystems and Foundries. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:2, pp:34-39 [Journal]
  34. Vladimir Székely, Márta Rencz, Bernard Courtois
    Tracing the Thermal Behavior of ICs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:2, pp:14-21 [Journal]
  35. Bernard Courtois
    Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen. [Citation Graph (0, 0)][DBLP]
    it - Information Technology, 2003, v:45, n:6, pp:- [Journal]
  36. René David, Antoine Fuentes, Bernard Courtois
    Random Pattern Testing Versus Deterministic Testing of RAM's. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1989, v:38, n:5, pp:637-650 [Journal]
  37. Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois
    Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1995, v:44, n:2, pp:223-233 [Journal]
  38. Ingrid Jansch, Bernard Courtois
    Definition and Design of Strongly Language Disjoint Checkers. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1988, v:37, n:6, pp:745-748 [Journal]
  39. Marcelo Lubaszewski, Bernard Courtois
    A Reliable Fail-Safe System. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1998, v:47, n:2, pp:236-241 [Journal]
  40. Michael Nicolaidis, Bernard Courtois
    Strongly Code Disjoint Checkers. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1988, v:37, n:6, pp:751-756 [Journal]
  41. Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois
    Analog checkers with absolute and relative tolerances. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1995, v:14, n:5, pp:607-612 [Journal]
  42. Bernard Courtois
    Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:7, pp:613- [Journal]
  43. Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois
    Design of self-checking fully differential circuits and boards. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2000, v:8, n:2, pp:113-128 [Journal]

  44. Generation of the HDL-A-model of a micromembrane from its finite-element-description. [Citation Graph (, )][DBLP]


  45. NAUTILE: a safe environment for silicon compilation. [Citation Graph (, )][DBLP]


  46. Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India. [Citation Graph (, )][DBLP]


  47. Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology [Citation Graph (, )][DBLP]


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